ISSN : 2663-2187

High-Performance Software Defect Prediction Across Multiple Datasets with Various Machine Learning Models

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Dr. K. Prakash, K.V. Nandini
» doi: 10.33472/AFJBS.6.6.2024.1675-1695

Abstract

Software defect prediction is vital for ensuring the reliability and stability of software systems. In this study, we present a comprehensive analysis of high-performance defect prediction across multiple datasets using various machine learning models. Specifically, we focus on three datasets: JM1, CM, and PC, each representing distinct software projects or domains

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